When analyzing a sample consisting of an extremely large number of micro-size parts, such as PCBs (printed circuit boards), it is necessary for the evaluation of the crystalline state of each part to use a focused X-ray beam and irradiate only a specific part. Optical systems in the past employed slits and collimators to convert the divergent beam emitted from the X-ray focal spot to a point focus beam. The downside to this technique is the large attenuation of the X-ray beam intensity, requiring a long time for micro-area measurement to be completed. By using the SmartLab μHR, a SmartLab model with microfocus optics, in combination with a high-speed 2D X-ray detector, a high-intensity micro-area measurement is possible in a short time even though the XG output is 1/10 of those in the past.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers