Measure almost any element in almost any matrix
X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems.
Handheld Metal Alloy Analysis
Within seconds, the Rigaku KT-100S handheld metal analyzer easily performs identification of the most difficult alloy grades. The KT-100S analyzer utilizes laser induced breakdown spectroscopy (LIBS) enabling durable and accurate alloy identification for use in scrap metal sorting, quality assurance in metal fabrication, and positive material identification (PMI) in mission-critical operations, such as aerospace and petrochemical.
アプリケーション・ノート
関連するアプリケーションノートをご紹介します
エネルギー分散蛍光Ｘ線分析装置
波長分散蛍光Ｘ線分析装置
リガクの関連装置
Total reflection XRF (TXRF)
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
WDXRF
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
EDXRF
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
