Skip to main content

Nanoparticle size analysis using SAXS and XRD techniques

AppNote XRD-SLNA_02: nano-particle size analysis using SAXS and XRD


X-ray techniques are often used to estimate the size of nanoparticles in the range of 1 – 100 nm because the commonly used X-ray’s wavelength, 0.154 nm for Cu Ka radiation for instance, is close to the size of nanoparticles and sensitive to the change of their size, shape, structure etc. Two techniques are used to estimate the size of nanoparticles: Small Angle X-ray Scattering (SAXS) and X-ray Diffraction (XRD). Both techniques provide the estimated size but use different types of scattering. This means that additional information about the nanoparticles can be extracted by comparing the results from those two techniques. SAXS: Diffuse scattering (Sample can be amorphous or crystalline.) XRD: Diffraction (Sample needs to be crystalline.) The SAXS and XRD techniques are applied to nanoparticle samples and the differences between the results are discussed in this presentation.

XRD products from Rigaku

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers