Elemental / phase analysis to molecular structure
Governments and industry collectively invest billions of dollars every year into the research and development of advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from space science and defense technology to consumer products. X-ray diffraction (XRD) is a primary technique for the study of advanced materials, including investigation of the following properties: identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, pore sizes, as well as much more. The influence of non-ambient conditions on these properties is also routinely studied with the XRD technique. Investigations may be carried out on samples of varying types, from powders, to solid materials of varying shapes and size, to solutions and semiconductor wafers. Rigaku technology and expertise provide a number of unique solutions for materials science applications.
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小角散乱測定装置(SAXS)
Ｘ線回折装置(XRD)
発生ガス分析装置, 熱分析装置
水晶・単結晶方位測定
工業用Ｘ線イメージング装置
リガクの関連装置
Small Molecule
Our most popular diffractometer for chemical crystallography, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
A benchtop single crystal X-ray diffractometer ideal for self-service crystallography and teaching.
A modern single crystal X-ray diffractometer for structural analysis of small molecule samples configured with microfocus sealed tube technology and a direct X-ray detection detector.
An extremely high-flux rotating anode X-ray diffractometer specifically configured for measuring difficult samples.
User-inspired data collection and data processing software for small molecule and protein crystallography
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
Ｘ線回折装置(XRD)
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Stress
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
WDXRF
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
EDXRF
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
X-ray CT
X-ray topography (XRT)
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
Thermal Analysis
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
Detectors
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Extremely low noise, compact, air-cooled X-ray detector based on direct X-ray detection technology.
小角散乱測定装置(SAXS)
A modernized 2D Kratky system that eliminates data corrections required of traditional systems