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製品情報

Optics

Custom focusing CMF X-ray optics for X-ray diffraction

Custom Confocal Max-Flux focusing optics for beamline applications

Multilayer optics for extreme UV lithography patterning of semiconductor wafers

Focusing graded multilayer monochromator for TXRF

Parallel beam graded multilayer monochromator for XRD

Light element analyzer for laboratory XRF instruments

Custom designed optics for EUV and X-ray sources

Custom designed optics for EUV and X-ray sources

Dual wavelength Confocal Max-Flux (CMF) optics for single crystal X-ray diffraction

Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction

Special CMF optic designed for SAXS instrumentation

NDT

Computed radiography mobile imaging plate scanner

200 kV microcomputerized directional industrial X-ray system

Small, light weight non-destructive testing X-ray generator

250 kV microcomputerized directional industrial X-ray system

300 kV microcomputerized directional industrial X-ray system

Foreign object X-ray inspection instrument

Foreign object X-ray inspection instrument

Foreign object X-ray inspection instrument

Total reflection XRF (TXRF)

The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

Stress

The world’s smallest portable stress analyzer that is specifically designed for field analysis

Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

X-ray topography (XRT)

A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging

Protein

A customized single crystal X-ray diffraction system that has the capabilities of utilizing both ports of a rotating anode X-ray source.

A microfocus sealed tube single crystal X-ray diffractometer that is low maintenance and perfect for screening and evaluating protein crystals.

A single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator and direct detection, HPC X-ray detector.

A versatile and high-flux dual-wavelength (DW) X-ray diffractometer with an HPC X-ray detector for multipurpose diffraction experiments

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

High-resolution X-ray detectors for X-ray diffractometers from DECTRIS

Automated crystal transport, orientation and retrieval robot

The smallest detachable motorized goniometer head on the market

Thermal Analysis

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.

DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.

Quantifies the energy changes in reactions such as melting, transition, crystallization and glass transition temperature.

DSC8271 is a high-temperature type DSC with a maximum temperature of 1,500°C.

TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.

 

TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.

 

The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.

 

TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.

Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of  evolved gases coincident with the STA signal.

In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.

Small Molecule

A benchtop single crystal X-ray diffractometer ideal for self-service crystallography and teaching.

Our most popular diffractometer for chemical crystallography, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.

An extremely high-flux rotating anode X-ray diffractometer specifically configured for measuring difficult samples.

A dual-wavelength, extremely high-flux, rotating anode X-ray diffractometer specifically configured for measuring difficult samples as well as providing versatility through multiple wavelengths.

A modern single crystal X-ray diffractometer for structural analysis of small molecule samples configured with microfocus sealed tube technology and a direct X-ray detection detector.

A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.

User-inspired data collection and data processing software for small molecule and protein crystallography

Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.

The smallest detachable motorized goniometer head on the market

小角散乱測定装置(SAXS)

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

Small and wide angle X-ray scattering instrument designed for nano-structure analyses

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

Small angle X-ray scattering (SAXS) Kratky camera system

X線回折装置(XRD)

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

X-ray CT

High-speed, stationary sample microtomography of large samples

High-resolution benchtop microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDXRF ultra low sulfur analyzer for method ASTM D2622

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

Tube below, single element WDXRF analyzer for quality control applications

EDXRF

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Process

Scanning multi-element process coatings analyzers for web or coil applications

EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)

Process sulfur analysis by X-ray transmission (X-ray absorption)

Raman

Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage

Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.

 The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics

Narcotics-focused analyzer to identify the latest opioid and fentanyl formations

Semiconductors

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers

Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers

In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers

Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers

Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples

Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers

XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers

LIBS

Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification

Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification

Detectors

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

A unique curved single crystal X-ray diffraction detector based on direct X-ray detection technology with the highest 2θ range at a single position available for the home lab.

Extremely low noise, air-cooled X-ray detector based on direct X-ray detection technology.

Extremely low noise, compact, air-cooled X-ray detector based on direct X-ray detection technology.

Calibrated metrology pA meter for intensity measurement

PILATUS3 R hybrid pixel array detector (HPAD) for X-ray crystallography

Compact 2D X-ray camera with micron and sub-micron resolution for imaging

Compact 2D X-ray camera for topography and imaging applications

Sources

Microfocus high-intensity sealed tube X-ray source

Microfocus rotating anode X-ray generator

High intensity microfocus rotating anode X-ray generator

Multi-purpose rotating anode X-ray generator

18 kW rotating anode X-ray generator