製品情報
Optics
NDT
Total reflection XRF (TXRF)
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Stress
The world’s smallest portable stress analyzer that is specifically designed for field analysis
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
X-ray topography (XRT)
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
Protein
A customized single crystal X-ray diffraction system that has the capabilities of utilizing both ports of a rotating anode X-ray source.
A microfocus sealed tube single crystal X-ray diffractometer that is low maintenance and perfect for screening and evaluating protein crystals.
A single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator and direct detection, HPC X-ray detector.
A versatile and high-flux dual-wavelength (DW) X-ray diffractometer with an HPC X-ray detector for multipurpose diffraction experiments
Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers
Thermal Analysis
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
Quantifies the energy changes in reactions such as melting, transition, crystallization and glass transition temperature.
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.
Small Molecule
A benchtop single crystal X-ray diffractometer ideal for self-service crystallography and teaching.
A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures
Our most popular diffractometer for chemical crystallography, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
An extremely high-flux rotating anode X-ray diffractometer specifically configured for measuring difficult samples.
A dual-wavelength, extremely high-flux, rotating anode X-ray diffractometer specifically configured for measuring difficult samples as well as providing versatility through multiple wavelengths.
A modern single crystal X-ray diffractometer for structural analysis of small molecule samples configured with microfocus sealed tube technology and a direct X-ray detection detector.
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
User-inspired data collection and data processing software for small molecule and protein crystallography
Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.
小角散乱測定装置(SAXS)
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Ｘ線回折装置(XRD)
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
X-ray CT
WDXRF
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U
EDXRF
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Raman
Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics
Semiconductors
Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Sequential WDXRF spectrometer for elemental analysis and thin-film metrology of large and/or heavy samples
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers
Detectors
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
A unique curved single crystal X-ray diffraction detector based on direct X-ray detection technology with the highest 2θ range at a single position available for the home lab.
Extremely low noise, air-cooled X-ray detector based on direct X-ray detection technology.
Extremely low noise, compact, air-cooled X-ray detector based on direct X-ray detection technology.
