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Ｘ線回折装置(XRD)
WDXRF
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小角散乱測定装置(SAXS)
Semiconductors
半導体関連装置
Products 2
Small molecule crystallography
単結晶X線構造解析 低分子関連装置
携帯型ラマン分光計
Handheld LIBS
プロセス制御
Products 3
Non-destructive testing
X線イメージング
X-ray topography
発生ガス分析装置
残留応力・歪測定
熱分析装置
Products 4
検出器
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Semiconductor metrology
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Sulfur analysis
Texture and pole figures
Thin film analysis
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Techniques 1
Biological SAXS
低分子構造解析
Combined XRD-DSC
Handheld Raman
Techniques 2
High-resolution XRD
High-temperature XRD
In-plane diffraction
Industrial SAXS / WAXS
Low-temperature diffraction
Microdiffraction
Techniques 3
Microtomography (X-ray CT)
Powder crystallography
Protein crystallography
Residual stress analysis
Rietveld analysis
SAXS
Techniques 4
Single crystal X-ray diffraction
X-ray diffraction (XRD)
X-ray fluorescence (XRF)
X-ray reflectometry (XRR)
X-ray topography (XRT)
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リガクのX線トポグラフ装置
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リガクのX線トポグラフ装置
リガクのX線トポグラフ装置
XRTmicron
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
