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Difference between quantitative results using the WPPF method and the RIR method

AppNote B-XRD1003: contrasting results using the WPPF method and the RIR method

Background

In quantitative analysis using X-ray diffractometry, different quantification methods are used depending on factors such as the state of the sample and concentration of the measured components. The method using calibration curves is complicated by the need to procure standard samples, or prepare and measure samples, and thus, at present, there is a switch toward analysis using the WPPF (Whole Powder Pattern Fitting) method and the RIR (Reference Intensity Ratio) method. In the WPPF method, profile fitting is performed over a comparatively broad angular range, based on information about the crystal system and lattice constants. The RIR method uses RIR values listed in a database and integrated intensity of the maximum intensity curves. Both methods enable easy calculation of quantitative values by using dedicated analysis software.

リガクのX線回折装置(XRD)

全自動多目的X線回折装置 SmartLab

装置が最適条件を教えてくれるガイダンス機能を実現。

全自動多目的X線回折装置 SmartLab SE

リガクの分析ノウハウを凝縮した「ガイダンス」機能を搭載。

デスクトップX線回折装置 MiniFlex

卓上タイプの高性能多目的粉末回折分析装置。

試料水平型多目的X線回折装置 Ultima IV

あらゆる用途のための高性能、多目的XRDシステム。