In quantitative analysis using X-ray diffractometry, different quantification methods are used depending on factors such as the state of the sample and concentration of the measured components. The method using calibration curves is complicated by the need to procure standard samples, or prepare and measure samples, and thus, at present, there is a switch toward analysis using the WPPF (Whole Powder Pattern Fitting) method and the RIR (Reference Intensity Ratio) method. In the WPPF method, profile fitting is performed over a comparatively broad angular range, based on information about the crystal system and lattice constants. The RIR method uses RIR values listed in a database and integrated intensity of the maximum intensity curves. Both methods enable easy calculation of quantitative values by using dedicated analysis software.